Publikationen

• Stephan Eggersglüß; Rolf Drechsler
  A Highly Fault-Efficient SAT-Based ATPG Flow.
  In: IEEE Design & Test of Computers, Vol. 29, No. 4, Pages 63-70, IEEE Press, 7/2012.
• Stephan Eggersglüß; Rene Krenz-Baath; Andreas Glowatz; Friedrich Hapke; Rolf Drechsler
  A New SAT-based ATPG for Generating Highly Compacted Test Sets.
  In: Proceedings. IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-12), April 18-20, IEEE-Verlag, 2012.
• Stephan Eggersglüß; Mahmut Yilmaz; Krishnendu Chakrabarty
  Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization.
  In: Proceedings. Asian Test Symposium (ATS-12), 21st, November 19-22, Niigata, Japan, IEEE-Verlag, 2012.
• Stephan Eggersglüß; Rolf Drechsler
  High Quality Test Pattern Generation and Boolean Satisfiability.
  ISBN 978-1-4419-9975-7, Springer, 3/2012.
• Stephan Eggersglüß; Rolf Drechsler
  As-Robust-As-Possible Test Generation in the Presence of Small Delay Defects using Pseudo-Boolean Optimization.
  In: Proceedings of the GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen. GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-11), February 27 - March 1, Passau, Germany, o.A. 2011.
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