Proceedings-Artikel
Fault Ordering for Automatic Test Pattern Generation of Reversible Circuits
Robert Wille; Hongyan Zhang; Rolf Drechsler
In: Proceedings of the 43rd International Symposium on Multiple-Valued Logic . The International Symposium on Multiple-Valued Logic (ISMVL-13), 43rd, May 22-24, Toyama, Japan, IEEE, 2013.