Publications

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Fei Chen; Sunita Saha; Manuela Schuler; Philipp Slusallek; Tim Dahmen
im2im: Automatically Converting In-Memory Image Representations using a Knowledge Graph Approach
In: Proceedings of the ACM on Programming Languages. International Conference on Object-Oriented Programming, Systems, Languages, and Applications (OOPSLA-2025), October 12-18, Singapore, Pages 248-273, Vol. 9, No. OOPSLA2, Association for Computing Machinery, New York, NY, USA, 10/2025.
Anindita Ghosh; Bing Zhou; Rishabh Dabral; Jian Wang; Vladislav Golyanik; Christian Theobalt; Philipp Slusallek; Chuan Guo (Hrsg.)
DuetGen: Music Driven Two-Person Dance Generation via Hierarchical Masked Modeling
ACM Siggraph (Siggraph-2025), The Premier Conference & Exhibition on Computer Graphics & Interactive Techniques, located at SIGGRAPH-2025, August 9-14, Vancouver, BC, Canada, No. 53, ISBN 9798400715402, Association for Computing Machinery, New York, NY, United States, 7/2025.
Hugo Devillers; Matthias Kurtenacker; Richard Membarth; Stefan Lemme; Michael Kenzel; Ömercan Yazici; Philipp Slusallek
No More Shading Languages: Compiling C++ to Vulkan SPIR-V
In: Symposium Papers of the High-Performance Graphics (HPG). ACM/Eurographics High-Performance Graphics (was Graphics Hardware/Symposium on Interactive Ray Tracing) (HPG-2025), June 23-25, Copenhagen, Denmark, Pages 1-10, ISBN 978-3-03868-291-2, The Eurographics Association, 6/2025.
Christian Wolff; Elke Warmerdam; Tim Dahmen; Tim Pohlemann; Philipp Slusallek; Bergita Ganse
New Parameters Based on Ground Reaction Forces for Monitoring Rehabilitation Following Tibial Fractures and Assessment of Heavily Altered Gait
In: Sensors - Open Access Journal (Sensors), Vol. 25, No. 8, Pages 1-15, MDPI, 4/2025.
Ulan Akmatbekov; Janis Sprenger; Rui Xu; Philipp Slusallek
Simulating Body Movements for Multiple Agent Avoidance
In: 2025 IEEE Conference on Virtual Reality and 3D User Interfaces Abstracts and Workshops. IEEE Conference on Virtual Reality and 3D User Interfaces Abstracts and Workshops (VRW) (IEEEVR-2025), located at IEEE VR 2025, March 8-12, Saint-Malo, France, Pages 730-735, IEEE Computer Society, 2025.
Joshua Meyer; Alexander Rath; Ömercan Yazici; Philipp Slusallek
MARS: Multi-sample Allocation through Russian roulette and Splitting
In: SIGGRAPH Asia 2024 Conference Papers. ACM SiggraphAsia (SigAsia-2024), December 3-6, Tokyo, Japan, SA '24 (SA '24), ISBN 9798400711312, Association for Computing Machinery, New York, NY, USA, 12/2024.
Kevin Herman Muraro Gularte; João Paulo Javidi da Costa; José Alfredo Ruiz Vargas; Antonio Santos da Silva; Giovanni Almeida Santos; Yuming Wang; Christian Alfons Müller; Christoph Lipps; Rafael Timóteo de Sousa; Walter de Britto Vidal Filho; Philipp Slusallek; Hans Dieter Schotten
Integrating Cybersecurity in V2X: A Review of Simulation Environments
In: IEEE Access (IEEE), Vol. 12, Pages 177946-177985, IEEE, 11/2024.
Philippe Weier; Alexander Rath; Élie Michel; Iliyan Georgiev; Philipp Slusallek; Tamy Boubekeur
N-BVH: Neural ray queries with bounding volume hierarchies
In: Andres Burbano; Denis Zorin; Wojciech Jarosz (Hrsg.). Proceedings - SIGGRAPH 2024 Conference Papers. ACM Siggraph (Siggraph-24), July 27 - August 1, Denver, CO, USA, Pages 1-11, Vol. 25, ISBN 979-8-4007-0525-0, Association for Computing Machinery, New York, NY, USA, 7/2024.
Christian Wolff; Patrick Steinheimer; Elke Warmerdam; Tim Dahmen; Philipp Slusallek; Christian Schlinkmann; Fei Chen; Marcel Orth; Tim Pohlemann; Bergita Ganse
Characteristic Changes of the Stance-Phase Plantar Pressure Curve When Walking Uphill and Downhill: Cross-Sectional Study
In: Journal of Medical Internet Research (JMIR), Vol. 26, Page e44948, JMIR Publications, 5/2024.
Kevin Herman Muraro Gularte; José Alfredo Ruiz Vargas; João Paulo Javidi da Costa; Antonio Santos da Silva; Giovanni Almeida Santos; Yuming Wang; Christian Alfons Müller; Christoph Lipps; Rafael Timóteo de Sousa Júnior; Walter de Britto Vidal Filho; Philipp Slusallek; Hans Dieter Schotten
Safeguarding the V2X Pathways: Exploring the Cybersecurity Landscape Through Systematic Review
In: IEEE Access (IEEE), Vol. 12, Pages 72871-72895, IEEE, 5/2024.