Publications

Displaying results 1 to 10 of 18

In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2020) October 19-21 Rome Italy 2020.

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In: Euromicro Conference on Digital System Design (DSD). Euromicro Conference on Digital System Design (DSD-2020) August 26-28 Portoro¸ Slovenia 2020.

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In: Proceedings of the 3rd International Test Conference in Asia (ITC-Asia). International Test Conference in Asia (ITC-Asia-2019) September 3-5 Tokyo Japan 2019.

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In: EUROMICRO Digital System Design Conference (DSD). Euromicro Conference on Digital System Design (DSD-2019) August 28-30 Kallithea, Chalkidiki Greece 2019.

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In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-30) 30th October 23-25 Cambridge United Kingdom 2017.

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In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017) March 27-31 Lausanne Switzerland 2017.

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In: 6th IEEE International Symposium on Embedded Computing & System Design (ISED). International Symposium on Electronic System Design (ISED-06) December 15-17 Patna India 2016.

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In: 22nd Asia and South Pacific Design Automation Conference ASP-DAC 2017. Asia and South Pacific Design Automation Conference (ASP-DAC-22) January 16-19 Tokio Japan 2017.

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In: 21st IEEE European Test Symposium. IEEE European Test Symposium (ETS-21) 21st May 24-27 Amsterdam Netherlands 2016.

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In: 28. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-28) March 6-8 Siegen Germany 2016.

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German Research Center for Artificial Intelligence
Deutsches Forschungszentrum für Künstliche Intelligenz