Analysis of Total Ionizing Dose effects for highly scaled CMOS devices in Low Earth Orbit

@article{pub9770,
    author = {

Sajida, Muhammad
 and 

Chechenin, Nikolay
 and 

Sill Torres, Frank
 and 

Hanif, Muhammad Nabeel
 and 

Gulzari, Usman Ali
 and 

Arslan, Shakaib
 and 

Khan, Ehsan Ullah
},
    title = {Analysis of Total Ionizing Dose effects for highly scaled CMOS devices in Low Earth Orbit},
    year = {2018},
    volume = {428},
    pages = {30--37},
    journal = {Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms},
    publisher = {Elsevier}
}