In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect …
Nathaniel Weir; Prasetya Utama; Alex Galakatos; Andrew Crotty; Amir Ilkhechi; Shekar Ramaswamy; Rohin Bhushan; Nadja Geisler; Benjamin Hättasch; Steffen Eger; Ugur Çetintemel; Carsten Binnig
In: Pinar Tözün; Alexander Böhm (Hrsg.). Proceedings of the 8th International Workshop on Testing Database Systems. International Workshop on Testing …