A Codeword-based Compaction Technique for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks

@inproceedings{pub9438,
    author = {Huhn, Sebastian and Merten, Marcel and Eggersglüß, Stephan and Drechsler, Rolf},
    title = {A Codeword-based Compaction Technique for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks},
    booktitle = {30. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2018). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-30), March 4-6, Freiburg im Breisgau, Germany},
    year = {2018}
}