Publikationen

In: IT - information technology (IT) De Gruyter Oldenbourg 1/2019.

In: Journal on Emerging Technologies in Computing Systems (JETC) 15 29 ACM 2019.

In: Design Automation Conference (DAC). Design Automation Conference (DAC-2019) June 2-6 Las Vegas United States 2019.

In: Design Automation Conference (DAC). Design Automation Conference (DAC-2019) June 2-6 Las Vegas Nevada United States 2019.

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In: Design Automation Conference (DAC). Design Automation Conference (DAC-2019) June 2-6 Las Vegas Nevada United States 2019.

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In: 6th Workshop on Design Automation for Understanding Hardware Designs (DUHDe). Workshop on Design Automation for Understanding Hardware Designs (DUHDe-06) DATE 2019 March 25-29 Florence Italy 2019.

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In: Proceedings of the 15th International Symposium on Applied Reconfigurable Computing (ARC). International Symposium on Applied Reconfigurable Computing (ARC-2019) April 9-11 Darmstadt Germany 2019.

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In: 31. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2019). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2019) February 24-26 Prien am Chiemsee Germany 2019.

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In: IEEE International Symposium on Circuits and Systems (ISCAS). IEEE International Symposium on Circuits and Systems (ISCAS-2019) May 26-29 Sapporo Japan 2019.

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In: 20th IEEE Latin American Test Symposium. IEEE Latin American Test Symposium (LATS-2019) March 11-13 Santiago Chile 2019.

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Publikationen

Aktive Filter:

Evaluation of (power) side-channels in cryptographic implementations

Placement & Routing for Tile-based Field-coupled Nanocomputing Circuits is NP-complete

RevSCA: Using Reverse Engineering to Bring Light intoBackward Rewriting for Big and Dirty Multipliers

Early Concolic Testing of Embedded Binaries with Virtual Prototypes: A RISC-V Case Study

Temporal Tracing of On-chip Signals using Timeprints

Towards Gate-Level Design of QCA Circuits

(ReCo) Fuse Your PRC or Lose Security: Finally Reliable Reconfiguration-based Countermeasures on FPGAs

IR-drop Prediction of Test Patterns Using Parasitic Elements

HotAging - Impact of Power Dissipation on Hardware Degradation

Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements

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