Publikation

Deep Learning for Sparse Scanning Electron Microscopy

Patrick Trampert, Sabine Schlabach, Tim Dahmen, Philipp Slusallek

In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019) August 4-8 Portland Oregon United States Cambridge University Press 2019.

Abstrakt

We investigated into a new approach that uses deep learning for the reconstruction of sparsely sampled SEM images.

deep_learning_for_sparse_scanning_electron_microscopy.pdf (pdf, 3 MB)

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence