Publikation

On Optimization-based ATPG and its Application for Highly Compacted Test Sets

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler

In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 2016.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence