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Publikationen

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  1. Pranav Sharma; Jigyasa Singh Katrolia; Jason Raphael Rambach; Bruno Mirbach; Didier Stricker

    Achieving RGB-D Level Segmentation Performance From a Single ToF Camera

    In: Proceedings of the. International Conference on Pattern Recognition Applications and Methods (ICPRAM-2024), February 24-26, Rome, Italy, …

  2. Malte Luttermann; Tanya Braun; Ralf Möller; Marcel Gehrke

    Colour Passing Revisited: Lifted Model Construction with Commutative Factors

    In: Proceedings of the Thirty-Eighth AAAI Conference on Artificial Intelligence. AAAI Conference on Artificial Intelligence (AAAI-2024), February …

  3. Towards a Model Factory Experimentation Environment for Cyber-Physical Twins

    In: Tung Bui (Hrsg.). Proceedings of the 57th Hawaiian International Conference on Systems Science. Hawaii International Conference on System Sciences …

  4. CaRaCTO: Robust Camera-Radar Extrinsic Calibration with Triple Constraint Optimization

    In: International Conference on Pattern Recognition Applications and Methods. International Conference on Pattern Recognition Applications and Methods …

  5. Andreas Luxenburger; Jonas Mohr; Dieter Merkel; Sönke Knoch; Daniel Porta; Christian Paul; Johannes Widenka; Philipp Schäfers; Markus Baumann; Stefan Lehnhoff; Joachim Schwab

    Interactive Digital Twins for Online Planning and Worker Safety in Intralogistics and Production

    In: Proceedings of the 6th IEEE International Conference on Artificial Intelligence & extended and Virtual Reality. IEEE International Conference on …

  6. JPPF: Multi-task Fusion for Consistent Panoptic-Part Segmentation

    In: SN Computer Science (SNCS), Vol. 5, Pages 0-16, Springer, 2024.

  7. Dynamic Realization of Multiple Control Toffoli Gate

    In: Design, Automation and Test in Europe Conference (DATE). Design, Automation & Test in Europe (DATE-2024), March 25 - February 27, Valencia, Spain, …

  8. Complete and Efficient Verification for a RISC-V Processor using Formal Verification

    In: Design, Automation and Test in Europe Conference (DATE). Design, Automation & Test in Europe (DATE-2024), March 25-27, Valencia, Spain, 2024.

  9. In-Memory SAT-Solver for Self-Verification of Programmable Memristive Architectures

    In: 37th International Conference on VLSI Design (VLSID). International Conference on VLSI Design (VLSID-2024), Kolkata, India, 1/2024.

  10. Ankit Bende; Simranjeet Singh; Chandan Jha; Tim Kemper; Felix Cüppers; Christopher Bengel; Andre Zambanini; Dennis Nielinger; Sachin Patkar; Rolf Drechsler; Rainer Waser; Farhad Merchant; Vikas Rana

    Experimental Validation of Memristor-Aided Logic Using 1T1R TaOx RRAM Crossbar Array

    In: 37 International Conference on VLSI Design (VLSID). International Conference on VLSI Design (VLSID-2024), Kolkata, India, 2024.