From Measuring the Quality of Labels in Process Models to a Discourse on Process Model Quality: A Case Study

Peter Fettke; Armella-Lucia Vella; Peter Loos
In: Jr. Ralph H. Sprague (Hrsg.). Proceedings of the 45th Annual Hawaii International Conference on System Sciences. Hawaii International Conference on System Sciences (HICSS), January 4-7, Grand Wailea, Maui, HI, USA, Pages 197-206, IEEE Computer Society, Los Alamitos, California, 1/2012.


Within the information systems field the application of modeling languages for conceptual modeling has gained tremendous importance. In this context, different works discuss aspects of label quality and its influence on process model quality. In order to deliver valuable results for the quality improvement of process models in practice, the applied measurement methods have to cover the multi-dimensional aspects of the process of process modeling. In fact, present works do not consider the different conceptualization possibilities of quality aspects adequately. Hence, we reconstruct the discourse on label quality in the first step to gain an overview of perspectives. Based on this analy-sis we take one participant position in the discourse on process model quality and with the help of an example demonstrate a different approach to interpret the examples' results.



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