Towards an Extended Metamodel of Event-driven Process Chains to Model Complex Event Patterns

Julian Krumeich; Nijat Mehdiyev; Dirk Werth; Peter Loos
In: 2nd International Workshop on Event Modeling and Processing in Business Process Management. International Workshop on Event Modelling and Processing in Business Process Management (EMoV-2015), located at 34th International Conference on Conceptual Modeling (ER 2015) , October 19-22, Stockholm, Sweden, Lecture Notes in Computer Science (LNCS), Vol. 9382, ISBN 978-3-319-25746-4, Springer, 2015.


This paper proposes an extension of the Event-driven Process Chain (EPC) metamodel in order to provide means to model complex event patterns within process models. There are some first attempts aiming to graphically depict such patterns; however, none of them focus EPC as a widely-used modeling language, especially in a business-related context. To do so, the paper first of all derives and defines typical complex event patterns and analyzes whether they are representable using standard EPC models. On this basis, a metamodel extension is conceived and additional modeling notations proposed. Finally, the notation is applied on two application examples



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