Ujwal Gadiraju; Sebastian Möller; Martin Nöllenburg; Dietmar Saupe; Sebastian Egger-Lampl; Daniel Archambault; Brian Fisher
In: Daniel Archambault; Helen Purchase; Tobias Hoßfeld (Hrsg.). Evaluation in the Crowd. Crowdsourcing and Human-Centered Experiments: Dagstuhl …
Markus Fiedler; Sebastian Möller; Peter Reichl; Min Xie
In: Dagstuhl Reports, Vol. 6, No. 11, Pages 129-141, Schloss Dagstuhl--Leibniz-Zentrum fuer Informatik, Dagstuhl, Germany, 2017.
Laura Fernández Gallardo; Rafael Zequeira Jiménez; Sebastian Möller
In: 18th Annual Conference of the International Speech Communication Association (INTERSPEECH 2017). Conference in the Annual Series of Interspeech …
Laura Fernández Gallardo; Sebastian Möller; John Beerends
In: 18th Annual Conference of the International Speech Communication Association (INTERSPEECH 2018). Conference in the Annual Series of Interspeech …
Patrick Ehrenbrink; Seif Osman; Sebastian Möller
In: Proceedings of the 29th Australian Conference on Human-Computer Interaction. Australian Conference on Human-Computer Interaction (OzCHI-2017), …
Sebastian Egger-Lampl; Judith Redi; Tobias Hoßfeld; Matthias Hirth; Sebastian Möller; Babak Naderi; Christian Keimel; Dietmar Saupe
In: Daniel Archambault; Helen Purchase; Tobias Hossfeld (Hrsg.). Evaluation in the Crowd. Crowdsourcing and Human-Centered Experiments: Dagstuhl …
Christoph Igel; Carsten Ullrich; Martin Wessner (Hrsg.)
e-Learning Conference of the German Computer Society (DeLFI-2017), September 5-8, Chemnitz, Germany, LNI, Vol. P-273, Gesellschaft für Informatik, …
Niklas Kreggenfeld; Christopher Prinz; Carsten Ullrich; Bernd Kuhlenkötter
In: Christoph Igel; Carsten Ullrich; Martin Wessner (Hrsg.). Bildungsräume 2017: DeLFI 2017, Die 15. e-Learning Fachtagung Informatik, der …
Johannes Bayer (Hrsg.)
IAPR International Workshop on Graphics Recognition (GREC-2017), located at 12th IAPR International Workshop on Graphics Recognition, Japan, 2017.
Faysal Boughorbel; Pavel Potocek; Milos Hovorka; Libor Strakos; John Mitchels; Tomas Vystavel; Patrick Trampert; Ben Lich; Tim Dahmen
In: Microscopy and Microanalysis, Vol. 23, No. S1, Pages 150-151, Cambridge University Press, 7/2017.
