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Data Flow Testing for SystemC-AMS Timed Data Flow Models

Muhammad Hassan; Daniel Große; Hoang M. Le; Rolf Drechsler
In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2019), March 25-29, Florence, Italy, 2019.


Internet-of-Things (IoT) devices have significantly increased the need for high quality Analog Mixed Signal (AMS) System-on-Chips (SoC). Virtual Prototyping (VP) can be utilized for an early design verification. The Timed Data Flow (TDF) model of computation available in SystemC-AMS offers here a good trade-off between accuracy and simulation-speed at the system-level. One of the main challenges in system-level verification of AMS design is to achieve full path coverage. In the software domain Data Flow Testing (DFT) has demonstrated to be a powerful testing strategy in this regard. In this paper we introduce a DFT approach for SystemC-AMS TDF models based on two major contributions: First, we develop a set of SystemC-AMS TDF models specific coverage criteria for DFT. This requires to consider the SystemC-AMS semantics of signal flow. Second, we explain how to automatically compute the data flow coverage result for given TDF models using a combination of static and dynamic analysis techniques. Our experimental results on real-world AMS VPs demonstrate the applicability and efficacy of our approach.