Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory

@inproceedings{pub16069,
    author = {

Jha, Chandan
 and 

Jha, Sumit Kumar
 and 

Schlichtmann, Ulf
 and 

Drechsler, Rolf
},
    title = {Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory},
    booktitle = {38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2025), October 21-23, Barcelona, Spain
},
    year = {2025},
    publisher = {IEEE}
}