Publication
Towards Increasing Test Compaction Abilities of SAT-based ATPG through Fault Detection Constraints
Stephan Eggersglüß; Melanie Diepenbeck; Robert Wille; Rolf Drechsler
In: Proceedings. IEEE Workshop on RTL and High Level Testing (WRTLT-12), IEEE, 2012.
Abstract
Automatic Test Pattern Generation (ATPG) based
on Boolean Satisfiability (SAT) is a robust alternative to classical
structural ATPG. Due to the powerful reasoning engines of
modern SAT solvers, SAT-based algorithms typically provide a
high test coverage because of the ability to reliably classify hardto-
detect faults. However, a weak point of SAT-based ATPG is the
test compaction ability. In this paper, we propose a new methodology
which combines the classical SAT-based ATPG formulation
with additional fault detection constraints resulting in a pseudo-
Boolean optimization problem. This leads to an increasing test
compaction ability of SAT-based ATPG. Experiments show that
the resulting test set generated by pure SAT-based ATPG without
any test compaction techniques can significantly be decreased by
up to 49%.