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Publication

Using Optimization Techniques to Increase Test Compaction

Stephan Eggersglüß; Kenneth Schmitz; Rene Krenz-Baath; Rolf Drechsler
In: IEEE Workshop on RTL and High Level Testing - Proceedings. IEEE Workshop on RTL and High Level Testing (WRTLT-13), 14th, November 21-22, Jiaosi, Taiwan, Province of China, IEEE, 2013.