Publications

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Christian Schorr; Sebastian Hocke; Tobias Masiak; Patrick Trampert
A Scalable Synthetic Data Creation Pipeline for AI-Based Automated Optical Quality Control
In: Proceedings of the 14th International Conference on Simulation and Modeling Methodologies, Technologies and Applications. International Conference on Simulation and Modeling Methodologies, Technologies and Applications (SIMULTECH-2024), July 10-12, Dijon, France, Pages 37-46, ISBN 978-989-758-708-5, SCITEPRESS, Portugal, 2024.
Christian Witte; René Schuster; Syed Saqib Bukhari; Patrick Trampert; Didier Stricker; Georg Schneider
Severity of Catastrophic Forgetting in Object Detection for Autonomous Driving
In: Proceedings of the International Conference on Pattern Recognition Applications and Methods. International Conference on Pattern Recognition Applications and Methods (ICPRAM-2023), February 22-24, Lissabon, Portugal, Scitepress, 2023.
Patrick Trampert; Dmitri Rubinstein; Faysal Boughorbel; Christian Schlinkmann; Maria Luschkova; Philipp Slusallek; Tim Dahmen; Stefan Sandfeld
Deep Neural Networks for Analysis of Microscopy Images—Synthetic Data Generation and Adaptive Sampling
In: Paolo Olivero (Hrsg.). Crystals, Vol. 11, No. 258, Pages 1-13, MDPI, 3/2021.
Christian Schlinkmann; Michael Roland; Christian Wolff; Patrick Trampert; Philipp Slusallek; Stefan Diebels; Tim Dahmen
A GPU-based caching strategy for multi-material linear elastic FEM on regular grids
In: PLOS ONE (PLOS), Vol. 15, No. 10, Pages 1-19, Public Library of Science, 10/2020.
Patrick Trampert; Tim Dahmen; Philipp Slusallek
Application of Missing Wedge Inpainting in Material Science
In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 8/2019.
Tim Dahmen; Patrick Trampert
An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation
In: Microscopy & Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Microscopy Society of America, 8/2019.
Tim Dahmen; Pavel Potocek; Patrick Trampert; Maurice Peemen; Remco Schoenmakers
Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures
In: Microscopy & Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 8/2019.
Tim Dahmen; Patrick Trampert
Sparse and Adaptive Sampling in Scanning Electron Microscopy
In: Microscopy and Microanalysis, Vol. 25, No. Issue s1 (Proceedings of CISCEM 2018 - the 4th Con, Pages 29-30, Cambridge University Press, 2/2019.
Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek
Deep Learning for Sparse Scanning Electron Microscopy
In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 2019.
Tim Dahmen; Patrick Trampert; Faysal Boughorbel; Janis Sprenger; Matthias Klusch; Klaus Fischer; Christian Kübel; Philipp Slusallek
Digital reality: a model-based approach to supervised learning from synthetic data
In: AI Perspectives, Vol. 1, Pages 1-12, Springer, 2019.