Publication

Fault Ordering for Automatic Test Pattern Generation of Reversible Circuits

Robert Wille, Hongyan Zhang, Rolf Drechsler

In: Proceedings of the 43rd International Symposium on Multiple-Valued Logic. IEEE International Symposium on Multiple-Valued Logic (ISMVL-2013) 43rd May 22-24 Toyama Japan IEEE 2013.

German Research Center for Artificial Intelligence
Deutsches Forschungszentrum für Künstliche Intelligenz