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Combined tilt- and focal series scanning transmission electron microscopy: TFS 3D STEM

Tim Dahmen; Jean-Pierre Baudoin; Andrew R. Lupini; Christian Kübel; Philipp Slusallek; Niels de Jonge
In: 18th International Microscopy Congress Proceedings. International Microscopy Congress (IMC-18), September 7-12, Prague, Czech Republic, Pages 786-787, Vol. 20, No. S3, Czechoslovak Microscopy Society, 8/2014.

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