Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

@inproceedings{pub8585,
    author = {

Dahmen, Tim
 and 

Slusallek, Philipp
 and 

Trampert, Patrick
 and 

Mücklich, Frank
 and 

Engstler, Michael
 and 

Pauly, Christoph
 and 

Jonge, Niels de
},
    title = {Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy},
    booktitle = {Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, United States},
    year = {2016},
    volume = {22},
    number = {Suppl 3},
    pages = {632},
    publisher = {Cambridge University Press}
}