In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …
Vasillis Vlachokyriakos; Clara Crivellaro; Peter C. Wright; Evika Karamagioli; Eleni-Revekka Staiou; Dimitris Gouscos; Rowan Thorpe; Antonio Krüger; Johannes Schöning; Matt Jones; Shaun W. Lawson; Patrick Olivier