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Embedded Intelligence

Publications

Page 2 of 4.

  1. Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek

    Deep Learning for Sparse Scanning Electron Microscopy

    In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 2019.

  2. Tim Dahmen; Patrick Trampert; Faysal Boughorbel; Janis Sprenger; Matthias Klusch; Klaus Fischer; Christian Kübel; Philipp Slusallek

    Digital reality: a model-based approach to supervised learning from synthetic data

    In: AI Perspectives, Vol. 1, Pages 1-12, Springer, 2019.

  3. Pavel Potocek; Remco Schoenmakers; Patrick Trampert; Tim Dahmen; Maurice Peemen

    Sparse Scanning Electron Microscopy for Imaging and Segmentation in Connectomics

    In: 2018 IEEE International Conference on Bioinformatics and Biomedicine (BIBM). IEEE International Conference on Bioinformatics and Biomedicine …

  4. Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek

    Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy

    In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 700-701, Cambridge University Press, 8/2018.

  5. Tim Dahmen; Patrick Trampert; Philipp Slusallek

    Blob-based Algebraic Reconstruction Technique for Computed Laminography

    In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 994-995, Cambridge University Press, 8/2018.

  6. Patrick Trampert; Tim Dahmen; Philipp Slusallek

    Fact or Fiction: Maximal Image Quality with Minimal Dwell Time

    In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 480-481, Cambridge University Press, 8/2018.

  7. Patrick Trampert; Wu Wang; Delei Chen; Raimond BG Ravelli; Tim Dahmen; Peter J Peters; Christian Kübel; Philipp Slusallek

    Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography

    In: Ultramicroscopy, Vol. 191, Pages 1-10, Elsevier, 8/2018.

  8. Patrick Trampert; Faysal Bourghorbel; Pavel Potocek; Maurice Peemen; Christian Schlinkmann; Tim Dahmen; Philipp Slusallek

    How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?

    In: Ultramicroscopy, Vol. 191, Pages 11-17, Elsevier, 8/2018.

  9. Kelly Parker; Patrick Trampert; Verena Tinnemann; Diana Peckys; Tim Dahmen; Niels de Jonge

    Linear Chains of HER2 Receptors Found in the Plasma Membrane Using Liquid-Phase Electron Microscopy

    In: Biophysical Journal, Vol. 115, Pages 503-513, Elsevier, 6/2018.

  10. Faysal Boughorbel; Pavel Potocek; Milos Hovorka; Libor Strakos; John Mitchels; Tomas Vystavel; Patrick Trampert; Ben Lich; Tim Dahmen

    High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing

    In: Microscopy and Microanalysis, Vol. 23, No. S1, Pages 150-151, Cambridge University Press, 7/2017.

Contact

Office:
Shannon Kittrell, B.A.
Phone: +49 631 20575 4010

Deutsches Forschungszentrum für Künstliche Intelligenz GmbH (DFKI)
Research Department Embedded Intelligence
Trippstadter Str. 122
67663 Kaiserslautern
Germany