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Publication

Large Language Models (LLMs) for Verification, Testing, and Design

Chandan Jha; Muhammad Hassan; Khushboo Qayyum; Sallar Ahmadi-Pour; Ruidi Qiu Kangwei Xu; Jason Blocklove; Luca Collini; Andre Nakkab; Ulf Schlichtmann; Yalin Zhang; Ramesh Karri; Bing Li; Siddharth Garg; Rolf Drechsler
In: 30th IEEE European Test Symposium. IEEE European Test Symposium (ETS-2025), May 26-30, Tallinn, Estonia, IEEE, 2025.

Abstract

Large Language Models (LLMs) are being explored for their use in the domain of Electronic Design Automation (EDA). In this paper, we discuss state-of-the-art works showing the use of LLMs in verification, testing, and design generation. We provide a summary of the existing works and highlight the methods that have been used to enhance the quality of the output of the LLMs, like prompt engineering, Retrieval Augmented Generation (RAG), fine-tuning, multi-shot prompting, etc. We show that LLMs can aid in the domain of EDA, however, several challenges need to be addressed, such as data availability for finetuning the LLMs, integration with EDA tools, scalability, etc. This paper aims to highlight the use of LLMs in EDA, improve the output quality when using LLMs, and highlight the challenges and future directions that can be useful for further research.

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