Skip to main content Skip to main navigation


Displaying results 31 to 40 of 720.
  1. Jens Trommer; Niladri Bhattacharjee; Thomas Mikolajick; Sebastian Huhn; Marcel Merten; Mohammed E. Djeridane; Muhammad Hassan; Rolf Drechsler; Shubham Rai; Nima Kavand; Armin Darjani; Akash Kumar; Violetta Sessi; Maximilian Drescher; Sabine Kolodinski; Maciej Wiatr

    Design Enablement Flow for Circuits with Inherent Obfuscation based on Reconfigurable Transistors

    In: Design, Automation and Test in Europe Conference (DATE 2023). Design, Automation & Test in Europe (DATE-2023), April 17-19, Antwerp, Belgium, …

  2. On the Future of Training Spiking Neural Networks

    In: International Conference on Pattern Recognition Applications and Methods. International Conference on Pattern Recognition Applications and Methods …

  3. POWOP: Weather-based Power Outage Prediction (**Best Poster Award**)

    In: IntelliSys 2023. Intelligent Systems Conference (IntelliSys-2023), September 7-8, Amsterdam, Netherlands, SAI IntelliSys, 9/2023.

  4. Driving Activity Recognition Using UWB Radar and Deep Neural Networks

    In: Sensors - Open Access Journal (Sensors), Vol. 23, No. 2, Pages 1-15, MDPI, 1/2023.

  5. Evaluating Synthetic vs. Real Data Generation for AI-Based Selective Weeding

    In: Resiliente Agri-Food-Systeme: Herausforderungen und Lösungsansätze. GIL-Jahrestagung (GIL-2023), February 13-14, Osnabrück, Germany, Gesellschaft …

  6. Daniel Tille; Leon Klimasch; Sebastian Huhn

    A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin

    In: 41st IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2023), April 24-26, San Diego, CA, USA, 2023.

  7. Monetary Valuation of Data in the Context of Accounting

    In: Daniel Trauth; Thomas Bergs; Wolfgang Prinz. The Monetization of Technical Data: Innovations from Industry and Research. Pages 103-116, ISBN …

  8. Rune Krauss; Mehran Goli; Rolf Drechsler

    Efficient Binary Decision Diagram Manipulation by Reducing the Number of Intermediate Nodes

    In: 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE International Symposium on Design and …