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Publications

Displaying results 561 to 570 of 13863.

  1. Sallar Ahmadi-Pour; Sajjad Parvin; Chandan Jha; Rolf Drechsler

    FV-LIDAC: Formally Verified Library of Input Data Aware Approximate Arithmetic Circuits

    In: o.A. (Hrsg.). ACM Transactions on Design Automation of Electronic Systems (TODAES), Vol. 30, ACM, 2025.

  2. Anthony Kiggundu; Bin Han; Hans Dieter Schotten

    Information Bulletin Strategy in Impatient Queuing

    In: IEEE CSCN Conference Proceedings. IEEE Conference on Standards for Communications and Networking (IEEE CSCN-2025), September 15-17, Bologna, Italy, IEEE Xplore, 10/2025.

  3. Zhifei Li; Gerrit Großmann; Verena Wolf

    Enhancing GNNs with Architecture-Agnostic Graph Transformations: A Systematic Analysis

    In: Hocine Cherifi; Murat Donduran; Luis M. Rocha; Chantal Cherifi; Onur Varol. International Conference on Complex Networks and Their Applications. Pages 183-194, Springer Nature Switzerland, 2024.

  4. Alex Peiró-Lilja; Rodolfo Zevallos; Carme Armentano-Oller; Jose Giraldo; Cristina España-Bonet; Mireia Farrús

    Towards Domain-Specific Spoken Language Understanding for a Catalan Voice-Controlled Video Game

    In: Interspeech 2025. Conference in the Annual Series of Interspeech Events (INTERSPEECH), Rotterdam, Netherlands, Pages 4965-4966, Interspeech, 2025.

  5. Rune Krauss; Luca Müller; Marius Marach; Rolf Drechsler

    BDD Meets SAT: Binary Hybrid Diagrams for Efficient Generation of Multiple Solutions

    In: Forum on Specification, Verification and Design Languages (FDL). Forum on Specification & Design Languages (FDL-2025), September 9-12, Schloß Rheinfels, St. Goar, Germany, 2025.

  6. Chandan Jha; Sumit Kumar Jha; Ulf Schlichtmann; Rolf Drechsler

    Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory

    In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2025), October 21-23, Barcelona, Spain, IEEE, 2025.

  7. Mohammad Reza Heidari Iman; Rolf Drechsler; Chandan Jha; Ali Azarpeyvand; Tara Ghasempouri; Sharjeel Imtiaz; Jaan Raik; Samuele Germiniani; Daniele Nicoletti; Graziano Pravadelli; Giorgio Di Natale

    Application of Functional Verification Techniques in Hardware Trust

    In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2025), October 21-23, Barcelona, Spain, IEEE, 2025.

  8. Miro Miranda Lorenz; Ashutosh Dinesh; Duway Nicolas Lesmes Leon; Francisco Mena; Marcela Charfuelan Oliva; Andreas Dengel (Hrsg.)

    RegDiff: Regression Diffusion for Earth Observation

    IEEE International Geoscience and Remote Sensing Symposium (IGARSS-2025), August 3-8, Brisbane, Australia, IEEE, 8/2025.

  9. Miro Miranda Lorenz; Francisco Mena; Marcela Charfuelan Oliva; Andreas Dengel (Hrsg.)

    Informed Learning for efficient Crop Yield Prediction

    IEEE International Geoscience and Remote Sensing Symposium (IGARSS-2025), August 3-8, Brisbane, Australia, IEEE, 2025.

  10. Malte Luttermann; Jan Speller; Marcel Gehrke; Tanya Braun; Ralf Möller; Mattis Hartwig

    Approximate Lifted Model Construction

    In: Proceedings of the Thirty-Fourth International Joint Conference on Artificial Intelligence. International Joint Conference on Artificial Intelligence (IJCAI-2025), August 16-22, Montreal, Canada, IJCAI Organization, 2025.

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