Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation

@inproceedings{pub10166,
    author = {

Sill Torres, Frank
 and 

Amrouch, Hussam
 and 

Henkel, Jörg
 and 

Drechsler, Rolf
},
    title = {Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation},
    booktitle = {IEEE International Reliability Physics Symposium (IRPS 2019). IRPS (IEEE International Reliability Physics Symposium) (IRPS-2019), March 31-April 4, Monterey, CA, United States},
    year = {2019}
}