Publikation
Harshad Dhotre; Stephan Eggersglüß; Rolf Drechsler
In: 20th IEEE Latin American Test Symposium. IEEE Latin American Test Symposium (LATS-2019), March 11-13, Santiago, Chile, 2019.
@inproceedings{pub10193, author = { Dhotre, Harshad and Eggersglüß, Stephan and Drechsler, Rolf }, title = {Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements}, booktitle = {20th IEEE Latin American Test Symposium. IEEE Latin American Test Symposium (LATS-2019), March 11-13, Santiago, Chile}, year = {2019} }
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