Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements

@inproceedings{pub10193,
    author = {

Dhotre, Harshad
 and 

Eggersglüß, Stephan
 and 

Drechsler, Rolf
},
    title = {Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements},
    booktitle = {20th IEEE Latin American Test Symposium. IEEE Latin American Test Symposium (LATS-2019), March 11-13, Santiago, Chile},
    year = {2019}
}