Publikation
Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler
In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.
@inproceedings{pub10241, author = { Sill Torres, Frank and Junior, Pedro F. R. Leite and Drechsler, Rolf }, title = {Unintrusive Aging Analysis based on Offline Learning}, booktitle = {30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom}, year = {2017} }
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