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An ILP-based Global Optimum Test Scheduler for IEEE 1687 Multi-Power Domain Networks

Payam Habiby; Sebastian Huhn; Rolf Drechsler
In: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2022), February 27 - March 1, Bremerhaven, Germany, 2022.


The IEEE 1687 standard defines a methodology for accessing embedded instruments in the state-of-the-art systemon-chips by introducing reconfigurable scan networks. This methodology enables a considerable reduction of the overall test time by shortening the length of the active scan chain. However, this new technique raises the need for effective test schedulers considering individual instruments’ constraints and multiple power domains. By this, it is ensured that the power criteria are met during the later test execution. This work tackles the arising challenges by proposing an entire test scheduler for multi-power domain IJTAG networks based on an integer linear programming optimization model. In contrast to existing works, the proposed scheduler determines the global optimal test sequence and, by this, yields the most effective and powersafe tests.