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Difficulty Estimation with Action Scores for Computer Vision Tasks

Luis Octavio Arriaga Camargo; Sebastian Palacio; Matias Valdenegro-Toro
In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops. International Conference on Computer Vision and Pattern Recognition (CVPR-2023), IEEE, 2023.


As more machine learning models are now being applied in real world scenarios it has become crucial to evaluate their difficulties and biases. In this paper we present an unsupervised method for calculating a difficulty score based on the accumulated loss per epoch. Our proposed method does not require any modification to the model, neither any external supervision, and it can be easily applied to a wide range of machine learning tasks. We provide results for the tasks of image classification, image segmentation, and object detection. We compare our score against similar metrics and provide theoretical and empirical evidence of their difference. Furthermore, we show applications of our proposed score for detecting incorrect labels, and test for possible biases.


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