As-Robust-As-Possible Test Generation in the Presence of Small Delay Defects using Pseudo-Boolean Optimization

@inproceedings{pub5272,
    author = {

Eggersglüß, Stephan
 and 

Drechsler, Rolf
},
    title = {As-Robust-As-Possible Test Generation in the Presence of Small Delay Defects using Pseudo-Boolean Optimization},
    booktitle = {Proceedings of the GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen. GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-11), February 27-March 1, Passau, Germany},
    year = {2011}
}