A New SAT-based ATPG for Generating Highly Compacted Test Sets

@inproceedings{pub6188,
    author = {

Eggersglüß, Stephan
 and 

Krenz-Baath, Rene
 and 

Glowatz, Andreas
 and 

Hapke, Friedrich
 and 

Drechsler, Rolf
},
    title = {A New SAT-based ATPG for Generating Highly Compacted Test Sets},
    booktitle = {Proceedings. IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-12), 15th, April 18-20, Tallinn, Estonia},
    year = {2012},
    publisher = {IEEE}
}