Publikation
Stephan Eggersglüß; Rene Krenz-Baath; Andreas Glowatz; Friedrich Hapke; Rolf Drechsler
In: Proceedings. IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-12), 15th, April 18-20, Tallinn, Estonia, IEEE, 2012.
@inproceedings{pub6188, author = { Eggersglüß, Stephan and Krenz-Baath, Rene and Glowatz, Andreas and Hapke, Friedrich and Drechsler, Rolf }, title = {A New SAT-based ATPG for Generating Highly Compacted Test Sets}, booktitle = {Proceedings. IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-12), 15th, April 18-20, Tallinn, Estonia}, year = {2012}, publisher = {IEEE} }
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