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Publikation

SAT-Based Post-Processing for Regional Capture Power Reduction in At-Speed Scan Test Generation

Stephan Eggersglüß; Kohei Miyase; Xiaoqing Wen
In: 21st IEEE European Test Symposium. IEEE European Test Symposium (ETS-21), located at 21st, May 24-27, Amsterdam, Netherlands, 2016.