Publikation

Unintrusive Aging Analysis based on Offline Learning

Frank Sill Torres, Pedro F. R. Leite Junior, Rolf Drechsler

In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017) October 23-25 Cambridge United Kingdom 2017.

Abstrakt

Runtime aging analysis of integrated circuits enables adaptive approaches in order to enhance the system’s life time and permits the user to be aware of critical states. Common approaches utilize sensors that are integrated invasively into critical paths or report experienced aging. This work presents a lightweight supportive technique that correlates environmental and internal conditions with learned data in order to predict the actual wear-out of the system. Simulation results indicate the feasibility of the approach with prediction errors below 10%.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence