Publikation
Payam Habiby, Sebastian Huhn, Rolf Drechsler
In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2020) October 19-21 Rome Italy 2020.