Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability

Payam Habiby, Sebastian Huhn, Rolf Drechsler

In: 33. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2021) February 21-23 Nordhausen Germany 2021.


The IEEE 1687 Std. provides an efficient access methodology for embedded instruments in complex system-on-achip designs by introducing reconfigurable scan networks. This flexibility enables the reduction of the overall test access time, which significantly decreases the test costs compared to the conventional daisy-chaining method. However, the new access methodology strictly requires new effective test schedulers that consider multi-power domains with individual constraints, as given on the chip-level. This work proposes a novel SAT-based optimization modeling scheme for complex IEEE 1687 networks with multi-power.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence