Publikation

A Memory-Upscaled Boolean Satisfiability Solver for Complex On-Chip Self-Verification Tasks

Buse Ustaoglu, Sebastian Huhn, Rolf Drechsler

In: Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE). Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE-2021) befindet sich Design, Automation and Test in Europe Conference (DATE 2021) February 1-5 Grenoble France 2021.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence