Publikation

Recent Advances in SAT-based ATPG: Non-Standard Fault Models, Multi Constraints and Optimization

Bernd Becker, Rolf Drechsler, Stephan Eggersglüß, Matthias Sauer

In: International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Proceedings. International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS-2014) May 6-8 San Torini Greece o.A. 2014.

Abstrakt

It is well-known that in principle automatic test pattern generation (ATPG) can be solved by transforming the circuit and the fault considered into a Boolean satisfiability (SAT) instance and then calling a so-called SAT solver to compute a test. More recently, the potential of SAT-based ATPG has been significantly extended. In this paper, we first provide introductory knowledge on SAT-based ATPG and then report on latest developments enabling applications far beyond classical ATPG.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence