Compact Test Set Generation for Test Compression-based Designs

@inproceedings{pub7687,
    author = {

Eggersglüß, Stephan
},
    title = {Compact Test Set Generation for Test Compression-based Designs},
    booktitle = {20th IEEE European Test Symposium. IEEE European Test Symposium (ETS-20), May 25-29, Cluj-Napoca, Romania},
    year = {2015}
}