Publikationen

Seite 5 von 5.

Stefan Agne; Hans-Günther Hein
A Pattern Matcher for OCR corrupted Documents and its Evaluation
In: Daniel P. Lopresti; Jiangying Zhou (Hrsg.). Document Recognition V. DDR Document Recognition and Retrieval (DDR), San Jose, Pages 160-168, …
Achim Weigel; Stefan Agne
Learning the Costs of Edit Operations for Edit Distances
In: Michael Frydrych; Jussi Parkkinen; Ari Visa (Hrsg.). Proceedings of the 10th Scandinavian Conference on Image Analysis. Scandinavian Conference on …