Publikationen

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Stephan Eggersglüß; Stefan Holst; Daniel Tille; Kohei Miyase; Xiaoqing Wen
Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test
In: The 25th Asian Test Symposium. Asian Test Symposium (ATS-25), November 21-24, Hiroshima, Japan, 2016.
Rolf Drechsler; Stephan Eggersglüß; Nils Ellendt; Sebastian Huhn; Lutz Mädler
Exploring Superior Structural Materials Using Multi-Objective Optimization and Formal Techniques
In: 6th IEEE International Symposium on Embedded Computing & System Design (ISED). International Symposium on Electronic System Design (ISED-06), …
Stephan Eggersglüß
Compact Test Set Generation for Test Compression-based Designs
In: 20th IEEE European Test Symposium. IEEE European Test Symposium (ETS-20), May 25-29, Cluj-Napoca, Romania, 2015.
Stephan Eggersglüß; Kenneth Schmitz; Rene Krenz-Baath; Rolf Drechsler
Hohe Testmengenkompaktierung durch formale Optimierungstechniken
In: ITG/GI/GMM-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen - Proceedings. GI/GMM/ITG Workshop Testmethoden und …
Stephan Eggersglüß; Kenneth Schmitz; Rene Krenz-Baath; Rolf Drechsler
Optimization-based Multiple Target Test Generation for Highly Compacted Test Sets
In: IEEE European Test Symposium - Proceedings. IEEE European Test Symposium (ETS-14), 19th, May 26-30, Paderborn, Germany, IEEE, 2014.
Stephan Eggersglüß; Görschwin Fey; Ilia Polian
Test digitaler Schaltkreise
Oldenbourg, 2014.
Bernd Becker; Rolf Drechsler; Stephan Eggersglüß; Matthias Sauer
Recent Advances in SAT-based ATPG: Non-Standard Fault Models, Multi Constraints and Optimization
In: International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Proceedings. International Conference on Design & …
Stephan Eggersglüß; Rolf Drechsler
An effective fault ordering heuristic for SAT-based dynamic test compaction techniques
In: IT - information technology (IT), Vol. 56, No. 4, Pages 157-164, Springer, 2014.
Stephan Eggersglüß
Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill
In: IEEE Asian Test Symposium - Proceedings. Asian Test Symposium (ATS-13), 22nd, November 18-21, Yilan, Taiwan, Province of China, IEEE, 2013.
Stephan Eggersglüß; Robert Wille; Rolf Drechsler
Improved SAT-based ATPG: More Constraints, Better Compaction
In: Proceedings of the 2013 IEEE/ACM International Conference on Computer-Aided Design. IEEE/ACM International Conference on Computer-Aided Design …