Publikation

Towards Generating Test Suites with High Functional Coverage for Error Effect Simulation

Aljoscha Windhorst, Hoang M. Le, Daniel Große, Rolf Drechsler

In: 1st International ESWEEK Workshop on Resiliency in Embedded Electronic Systems. International ESWEEK Workshop on Resiliency in Embedded Electronic Systems 1st October 8 Amsterdam Netherlands 2015.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence