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  1. The An Binh Nguyen; Pratyush Agnihotri; Christian Meurisch; Manisha Luthra; Rahul Dwarakanath; Jeremias Blendin; Doreen Böhnstedt; Michael Zink; Ralf Steinmetz

    Efficient Crowd Sensing Task Distribution Through Context-Aware NDN-Based Geocast

    In: 2017 IEEE 42nd Conference on Local Computer Networks (LCN). IEEE Conference on Local Computer Networks (LCN-2017), 42nd Conference on Local …

  2. Olga Zlatkin-Troitschanskaia; Gabriel Wittum; Andreas Dengel (Hrsg.)

    Positive Learning in the Age of Information (PLATO) - A blessing or a curse?

    ISBN 978-3-658-19566-3, Springer VS, Wiesbaden, 12/2017.

  3. Tandra Ghose; Yannik T. H. Schelske; Takeshi Suzuki; Andreas Dengel

    Low-level Pixelated Representations suffice for Aesthetically Pleasing Contrast Adjustment in Photographs

    In: Psihologija, Vol. 50, No. 3, Pages 239-270, Serbian Psychological Society, 2017.

  4. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  5. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  6. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  7. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  8. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …