Publikation

Deep Learning for Sparse Scanning Electron Microscopy

Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek

In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 2019.

Zusammenfassung

We investigated into a new approach that uses deep learning for the reconstruction of sparsely sampled SEM images.

deep_learning_for_sparse_scanning_electron_microscopy.pdf (pdf, 3 MB )

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence