Publikation
Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek
In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 2019.
deep_learning_for_sparse_scanning_electron_microscopy.pdf (pdf, 3 MB )
@inproceedings{pub10668, author = { Trampert, Patrick and Schlabach, Sabine and Dahmen, Tim and Slusallek, Philipp }, title = {Deep Learning for Sparse Scanning Electron Microscopy}, booktitle = {Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, United States}, year = {2019}, publisher = {Cambridge University Press} }
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