Background Variability Modeling for Statistical Layout Analysis

@inproceedings{pub4343,
    author = {

Shafait, Faisal
 and 

van Beusekom, Joost
 and 

Keysers, Daniel
 and 

Breuel, Thomas
},
    title = {Background Variability Modeling for Statistical Layout Analysis},
    booktitle = {Proceedings of the 19th International Conference on Pattern Recognition. International Conference on Pattern Recognition (ICPR-2008), December 8-11, Tampa, Florida, United States},
    year = {2008},
    publisher = {IEEE}
}