TFS: Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy

@inproceedings{pub7629,
    author = {

Dahmen, Tim
 and 

Baudoin, Jean-Pierre
 and 

Lupini, Andrew R.
 and 

Kübel, Christian
 and 

Slusallek, Philipp
 and 

Jonge, Niels de
},
    title = {TFS: Combined Tilt- and Focal Series for Scanning Transmission Electron Microscopy},
    booktitle = {M&M 2014 Proceedings. Microscopy & Microanalysis (M&M-2014), August 3-7, Hartford, CT, United States},
    year = {2014},
    volume = {20 (Suppl.3)},
    pages = {786--787},
    organization = {Microscopy Society of America},
    publisher = {Cambridge University Press},
    isbn = {doi: 10.1017/S1431927614005650}
}