Publikation

Combined tilt- and focal series scanning transmission electron microscopy: TFS 3D STEM

Tim Dahmen, Jean-Pierre Baudoin, Andrew R. Lupini, Christian Kübel, Philipp Slusallek, Niels de Jonge

In: 18th International Microscopy Congress Proceedings. International Microscopy Congress (IMC-18) September 7-12 Prague Czech Republic Seiten 786-787 20 S3 Czechoslovak Microscopy Society 8/2014.

Weitere Links

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence