Publikationen

In: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2022) February 27-March 1 Bremerhaven Germany 2022.

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In: 40th IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2022) April 25-27 San Diego United States 2022.

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In: The Genetic and Evolutionary Computation Conference (GECCO). Genetic and Evolutionary Computation Conference (GECCO-2021) July 10-14 Lille/Virtual France 2021.

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In: Proceedings of the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2021) October 6-8 Athens/Virtual Greece 2021.

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In: Genetic and Evolutionary Computation Conference (GECCO). Genetic and Evolutionary Computation Conference (GECCO-2020) July 8-12 Cancun Mexico 2020.

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Publikationen

Quality Assessment of RFET-based Logic Locking Protection Mechanisms using Formal Methods

A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection

ALF – A Fitness-Based Artificial Life Form for Evolving Large-Scale Neural Networks

A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks

Efficient Machine Learning through Evolving Combined Deep Neural Networks

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